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       MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.

 

Product's Feature：

■ Non-contact and non-invasive measurement

■ Portable measure head

■ Materials: Si, Ge

■ Application:

■ Material quality control

■ Incoming ingot & wafer inspection

■ Heavy metal contamination detection inprocessed wafers

 



Typical Customer: 

American,Europe and Asia and so on.